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As a core component of a probe station, the probe holder serves as the interface
As a core component of a probe station, the probe holder serves as the interface between the probe tip and the signal cables, providing electrical connectivity for semiconductor device testing. Probe holders can be categorized based on positioning accuracy, with available resolutions including 10 μm, 5 μm, 3 μm, 1 μm, and 0.5 μm.
In terms of operation mode, they are available in both manual and motorized versions. According to different application scenarios, probe holders are further classified into types such as standard, universal-angle (goniometric), and L-shaped probe holders. They are widely used for electrical parameter testing in the semiconductor and optoelectronics industries.
● Main body made of imported aerospace-grade aluminum, ensuring high structural stability and precise linear displacement
● Precision-machined dovetail guideways used for displacement components to guarantee positioning accuracy
● Handwheel-driven mechanism with dual set screw design for enhanced mechanical stability
● Multifunctional adjustment clamp supports 180° rotation and 60° directional tilt, allowing precise orientation of the probe under the microscope without obstructing the field of view
● High-strength magnetic base with controllable magnetism; provides 5 kg of magnetic holding force for stable probe positioning
Suitable for RF MeasurementsI/O Point TestingDC TestingWafer TestingResistance & Voltage TestingSolar Cell Testing Photocurrent TestingSemiconductor Device Analysis & Testing
