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The probe station, also known as the probe test station, is primarily used to pr
The probe station, also known as the probe test station, is primarily used to provide a testing platform for the electrical parameter testing of semiconductor chips. It can accommodate chips of various specifications and offers multiple adjustable test probes and probe holders. When paired with measuring instruments, it can perform parameter testing such as voltage, current, resistance, and capacitance-voltage characteristic curves for integrated circuits. It is suitable for research experiments and analysis of materials, chips, and other components, as well as for random testing.
In recent years, the rapid advancement of flexible electronics, wearable sensors, human–machine interaction, energy harvesting, and soft robotics has drawn significant attention from researchers worldwide. These applications often involve flexible thin-film materials and piezoelectric films, which demand specialized in-situ testing capabilities.
In response to these emerging research needs, our company has developed the TLPS-E Series In-situ High-Precision Motorized Stretching Probe Station. This system provides a dedicated research solution for flexible films and piezoelectric materials, enabling precise testing of electrical or optoelectronic performance under controlled curvature and mechanical deformation. It serves as a powerful tool for studying the behavior of advanced materials under various stretching and bending conditions.
● XY manual sample stage with 2D adjustment; overall adjustment precision up to 3 μm
● Ultra-thin 4-axis motorized stretching platform with repeatability up to 1 μm
● Threaded top fixture with four-direction clamping; customizable based on experimental needs
● Equipped with laser microscope and 5-position objective turret, supports laser input for photocurrent testing
● Integrated motor control system, controllable via PC or precision joystick
● Supports up to 3 high-precision (3 μm) DC micropositioning probe holders (optional)
● Leakage current measurement resolution up to 10 pA / 100 fA (within shielded enclosure)
● Microscope XY auxiliary module available with 50 mm travel, adjustment accuracy 3 μm
● Motorized microscope Z-axis module, 150 mm travel, repositioning accuracy up to 1 μm
Optical Isolation Platform (table surface > 600mm * 600mm), One computer (with standard VGA and USB interfaces), Keithley 2400 Digital SourceMeter (including software), etc.
During testing, connect the probe station and digital source meter. The probes are connected to the object under test. Use a microscope to observe and confirm that the two probes are in contact with the surface of the object under test. Once the connection is established, open the source meter software, select the appropriate parameters, and the I-V characteristic curve for the contact point can be obtained.
Flexible Electronic Materials and DevicesPiezoelectric Thin FilmsSemiconductor Piezoelectric MaterialsFlexible and Wearable DevicesTransducersPiezoelectric Sensing
