As a vital component of the probe station system, the vacuum pump is primarily u
As a vital component of the probe station system, the vacuum pump is primarily used to connect to the vacuum chuck, enabling reliable adsorption and fixation of the device under test (DUT). This provides a stable foundation for subsequent probing and electrical testing.
The benchtop vacuum pump offered by our company features an original imported pump core with strong suction power. It operates oil-free and maintenance-free, eliminating the need for additional lubrication.
Equipped with a noise-reduction and vibration-damping system, it effectively minimizes environmental interference during precision testing. This pump is widely used in semiconductor electrical measurements, chip testing, and 2D material transfer applications.
● Equipped with an original imported pump core for strong suction performance
● Noise reduction and anti-vibration design to minimize experimental interference
● Multiple external vacuum channels for direct connection to vacuum chucks
● Achieves vacuum level of –33.3 kPa (–250 ㎜Hg)
● Airflow output up to 7 L/min,Durability: Operating life up to 10,000 hours
● Constructed with an aluminum alloy base and anodized finish, offering a compact and aesthetic design