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Short-Wave Infrared CameraProduct AppearanceProduct DescriptionA scientific-grad
A scientific-grade, large-format, high-resolution InGaAs short-wave infrared camera, specifically designed for low-light SWIR research imaging and microscopy. Suitable for fluorescence imaging, laser spot tracking, semiconductor inspection, solar cell testing, hyperspectral imaging, and more.
● InGaAs detector, sensitivity 0.4–1.7 µm
● Thermoelectric cooling, ⩾ 20 °C temperature drop
● Optimized for low-light SWIR research imaging and microscopy
● Dark-level correction for excellent uniformity
● GigE interface, Vision standard compliant
● Driver-free support for Halcon, VisionPro, etc.
Ideal for fluorescence imaging, laser spot tracking, semiconductor inspection, solar cell testing, hyperspectral imaging, and more.
The FDR-LEM-18NIR industrial line-scan camera, developed in-house for large-area and high-speed production line inspection. Features a domestic InGaAs sensor, GigE interface, 1K resolution, up to 18 kHz line rate, boosting efficiency and precision in industrial inspection. Integrated ISP algorithms, supporting line-trigger and frame-trigger modes. The MV-GEL101 offers a cost-effective, high-performance solution.
● InGaAs sensor, 900–1700 nm band
● Line rate up to 20 kHz, software adjustable
● Hardware supports horizontal pixel ROI and vertical line stitching
● Encoder signal division/multiplication for precise motion matching
● Supports encoder sync, photointerrupter + encoder trigger modes
● Widely used in printing, PV panel inspection, display testing, PCB printing, metal/plastic/fiber inspection
Printing, PV panel inspection, display testing, PCB printing, metal/plastic/fiber inspection, etc.
For detailed specifications or to place an order, visit our store: Specialty Cameras (SWIR & Line-Scan)
