Products

Confocal Raman Microspectroscopy System

The Prms confocal micro-Raman spectroscopy system is a high-end micro-Raman material characterization platform independently developed by Apispectrum (Puliang Optoelectronics), leveraging its years of expertise in spectral instrumentation R&D and industry applications. Seamlessly integrating ultra-high-resolution optical microscopic imaging with high-precision Raman spectral detection, the system features an integrated, highly stable microscopic testing optical path and a high-speed, high-resolution area scanning core module.

产品介绍
Confocal Micro-Raman Spectroscopy System

Confocal Micro-Raman Spectroscopy System

The Prms Confocal Micro-Raman Spectroscopy System is a high-end micro-Raman materials characterization platform independently developed by PL Optics, building on years of experience in spectroscopic instrument R&D and industry applications.

The system combines ultra-high-resolution optical microscopy with high-precision Raman spectroscopy and incorporates an integrated, high-stability microscopic measurement optical path together with a high-speed, high-resolution area-scanning core module. It comes standard with a large-travel, high-precision motorized XY scanning stage for micrometer-scale, high-resolution point-by-point Raman Mapping acquisition. A closed-loop motorized Z-axis module is also integrated with our proprietary intelligent vision-based focusing algorithm to automatically compensate for defocus caused by sample topography and optical-path drift. This minimizes invalid acquisitions and spectral signal attenuation or distortion, ensuring uniform and complete spectral data across the entire scan area with stable and highly reproducible results. The system is widely applicable to nondestructive microscale characterization of 2D materials, functional thin films, optoelectronic semiconductors, and related samples.

Technical Advantages:

  • Fiber-optic confocal technology for a high signal-to-noise ratio
  • Multi-level adjustable excitation power for different sample types
  • LED Köhler illumination for a uniform field of view and clear imaging
  • 532 nm / 785 nm dual-wavelength optical path configuration
  • Integrated motorized Z-axis module with intelligent autofocus

Applications:

  • Structural characterization of low-dimensional materials
  • Microscale analysis of semiconductor optoelectronic devices
  • Micro/nanostructure inspection of optoelectronic devices
  • Characterization of microscopic material distribution and defects
  • Structural studies of catalytic materials for new-energy applications

System Details:

Confocal Micro-Raman Spectroscopy System

Technical Specifications:

ModelPrms-X-532Prms-X-785Prms-XD
Excitation Wavelength532nm785nm532nm&785nm
Laser Power>100mW@532nm;>200mW@785nm
Raman Spectral Range120–3200 cm-1 @ cooled fiber-optic spectrometer; 100–10000 cm-1 @ deep-cooled triple-grating spectrometer
Raman Spectral Resolution≤10 cm-1 @ cooled fiber-optic spectrometer; ~1.5 cm-1 @ deep-cooled triple-grating spectrometer
Spatial Resolution≤500 nm @ 100X / 532 nm; ≤800 nm @ 100X / 785 nm
Excitation Spot Diameter≤1 μm @ 100X / 532 nm; ≤1.5 μm @ 100X / 785 nm
Motorized Scanning StageTravel: 75 mm &times; 50 mm; minimum step size: 0.01 &mu;m; bidirectional repeatability: <1 &mu;m
Objectives5X, 10X, 20X, 50X, 100X
Microscopic ImagingLED K&ouml;hler illumination; 5-megapixel imaging unit
DetectorCooled fiber-optic spectrometer (2048 &times; 64, -10&deg;C) / deep-cooled triple-grating spectrometer (2048 &times; 2048, -70&deg;C)
SoftwareRaman spectral measurement, Raman Mapping, microscopic imaging, user-defined measurement points and scan areas, multi-format data storage, secondary data import for analysis and processing, API data access, and more
Optional Accessories633 nm excitation, motorized Z-axis module (automatic focus compensation), polarized Raman, fluorescence lifetime module, vacuum/cryogenic options, and more

Typical Test Data:

Silicon Wafer Test Data
Silicon Wafer &uarr;
Carbon Nanotube Test Data
Carbon Nanotube &uarr;
Graphene Test Data 1
Graphene &uarr;
Graphene Test Data 2
Graphene &uarr;

Typical 2D Material Test Results

Monolayer WSe₂

Monolayer WSe₂ Bright-Field Image
(Monolayer WSe₂ Bright-Field Image)
Monolayer WSe₂ Raman Mapping Image
(Monolayer WSe₂ Raman Mapping Image)
Monolayer WSe₂ Raman Spectrum
(Monolayer WSe₂ Raman Spectrum)

Monolayer MoS₂

Monolayer MoS₂ Bright-Field Image
(Monolayer MoS₂ Bright-Field Image)
Monolayer MoS₂ Raman Mapping Image
(Monolayer MoS₂ Raman Mapping Image)
Monolayer MoS₂ Raman Spectrum
(Monolayer MoS₂ Raman Spectrum)

Monolayer WS₂

Monolayer WS₂ Bright-Field Image
(Monolayer WS₂ Bright-Field Image)
Monolayer WS₂ Raman Mapping Image
(Monolayer WS₂ Raman Mapping Image)
Monolayer WS₂ Raman Spectrum
(Monolayer WS₂ Raman Spectrum)

Prms can be customized and upgraded according to application requirements. We also provide a complete range of microscale optical characterization solutions, including micro-Raman spectroscopy, micro-fluorescence spectroscopy, second-harmonic generation (SHG), microscopic photocurrent measurement, and microscopic transmission/reflection spectroscopy. Please contact us for further details.

标签:

025-86550730