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Microscopic Second-Harmonic Generation (SHG) Spectroscopy System
Second-harmonic generation (SHG) is a second-order nonlinear optical effect in which a material generates a coherent optical signal at twice the frequency of the incident light under intense laser excitation. SHG can be observed only in structures lacking inversion symmetry. This spectroscopic technique requires no fluorescent labeling and enables nondestructive characterization of crystal structures, molecular ordering, biological collagen fibers, and other microscopic features, making it a key characterization method in micro/nano-optics and bioimaging.
The Astra SP Microscopic Second-Harmonic Generation (SHG) Spectroscopy System is a high-end microscopic spectroscopy platform independently developed by PL Optics, building on years of experience in spectroscopic instrument R&D and industry applications. The system combines ultra-high-resolution optical microscopy with high-precision nonlinear spectroscopic detection and integrates a highly stable microscopic measurement optical path with a high-speed, high-resolution area-scanning core module. It supports single-point SHG spectral acquisition, high-precision two-dimensional Mapping, polarization-dependent SHG polar-plot measurements, and other core nonlinear-optical functions. The system can simultaneously output microscopic morphology images and quantitative nonlinear-optical data, enabling comprehensive characterization of morphology, spatial signal distribution, crystal orientation, and second-order nonlinear polarization properties in a single platform. Equipped with a high-sensitivity single-photon detector (APD), it provides enhanced sensitivity for weak signals from monolayer 2D materials and is widely applicable to nonlinear characterization of 2D materials, crystalline thin films, metasurfaces, and other microscopic samples.
Technical Advantages:
- Fully integrated all-in-one design
- Dual detection optical paths for different measurement scenarios
- High-precision polarization optics with automated polarization-response acquisition
- Submicron-resolution 2D Mapping scanning platform
- Multiple excitation wavelength options: 1030 / 1064 / 1550 nm
Applications:
- Nonlinear characterization of 2D materials
- Characterization of micro/nano metastructured devices
- Characterization of functional crystalline thin films
- Nonlinear effects in integrated photonic chips
- Semiconductor wafer inspection
System Details:
Technical Specifications:
Typical Test Data:
Monolayer WSe2 Sample:
(Monolayer Bright-Field Image)
(SHG Mapping Image)
(SHG Spectrum)
(SHG Polarization Plot)
Monolayer WS2 Sample:
(Monolayer Bright-Field Image)
(SHG Mapping Image)
(SHG Spectrum)
(SHG Polarization Plot)
Monolayer MoS2 Sample:
(Monolayer Bright-Field Image)
(SHG Mapping Image)
(SHG Spectrum)
(SHG Polarization Plot)
Astra SP can be customized and upgraded according to application requirements. We also provide a complete range of microscale optical characterization solutions, including micro-Raman spectroscopy, micro-fluorescence spectroscopy, second-harmonic generation (SHG), microscopic photocurrent measurement, and microscopic transmission/reflection spectroscopy. Please contact us for further details.
