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As a core component of a probe station, the probe holder serves as the interface
As a core component of a probe station, the probe holder serves as the interface between the probe tip and the signal cables, providing electrical connectivity for semiconductor device testing. Probe holders can be categorized based on positioning accuracy, with available resolutions including 10 μm, 5 μm, 3 μm, 1 μm, and 0.5 μm.
In terms of operation mode, they are available in both manual and motorized versions. According to different application scenarios, probe holders are further classified into types such as standard, universal-angle (goniometric), and L-shaped probe holders. They are widely used for electrical parameter testing in the semiconductor and optoelectronics industries.
The universal-angle probe holder features multi-angle adjustability with easy locking at the desired orientation. It is designed for complex testing scenarios where probing cannot be performed in standard linear directions. This type of holder is especially suitable for irregular-shaped devices or samples requiring special positioning.
● Main body made of imported aerospace-grade aluminum, ensuring high structural stability and precise linear displacement
● Precision-machined dovetail guideways used for displacement components to guarantee positioning accuracy
● Handwheel-driven mechanism with dual set screw design for enhanced mechanical stability
● Equipped with a directional adjustment module, supporting 360° rotation and 360° tilt adjustment with locking capability
● Probe tip secured via threaded locking, compatible with probe needles of diameter ≤ 1 mm, ensuring high versatility
● High-strength adjustable magnetic base with up to 5 kg magnetic holding force for secure and stable contact
Suitable for RF MeasurementsI/O Point TestingDC TestingWafer TestingResistance & Voltage TestingSolar Cell Testing Photocurrent TestingSemiconductor Device Analysis & Testing
