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As a core component of a probe station, the probe holder serves as the interface
As a core component of a probe station, the probe holder serves as the interface between the probe tip and the signal cables, providing electrical connectivity for semiconductor device testing. Probe holders can be categorized based on positioning accuracy, with available resolutions including 10 μm, 5 μm, 3 μm, 1 μm, and 0.5 μm.
In terms of operation mode, they are available in both manual and motorized versions. According to different application scenarios, probe holders are further classified into types such as standard, universal-angle (goniometric), and L-shaped probe holders. They are widely used for electrical parameter testing in the semiconductor and optoelectronics industries.
The L-shaped probe holder features a compact design that allows the probe to approach the sample at a shallow angle. This makes it particularly suitable for testing components or circuit boards with high-density test points, effectively avoiding probe interference. The L-type configuration offers flexible positioning and can be selected according to the specific geometry and layout of the sample.
● Main body made of imported aerospace-grade aluminum, ensuring high structural stability and precise linear displacement
● Precision-machined dovetail guideways used for displacement components to guarantee positioning accuracy
● Handwheel-driven mechanism with dual set screw design for enhanced mechanical stability
● L-shaped probe clamp with fixed 45° insertion angle, offering ultra-high linearity for shallow-angle probing
● Single-screw probe clamp compatible with probes ≤ 0.5 mm in diameter, ensuring wide compatibility
● High-strength adjustable magnetic base with up to 5 kg of magnetic holding force for stable and secure contact during probing
Suitable for RF MeasurementsI/O Point TestingDC TestingWafer TestingResistance & Voltage TestingSolar Cell Testing Photocurrent TestingSemiconductor Device Analysis & Testing
