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As a core component of a probe station, the probe holder serves as the interface
As a core component of a probe station, the probe holder serves as the interface between the probe tip and the signal cables, providing electrical connectivity for semiconductor device testing. Probe holders can be categorized based on positioning accuracy, with available resolutions including 10 μm, 5 μm, 3 μm, 1 μm, and 0.5 μm.
As one of the core components of a probe station, the probe feedthrough cable connects the probe to the source meter, providing a shielded and reliable electrical path.
PLCTS Optoelectronics’ high-precision feedthrough cable features an additional outer shielding layer on top of standard shielding, forming a dual-layer isolation structure that significantly enhances leakage current performance. Measured accuracy reaches the femtoampere (fA) level.
Integrated with PLCTS’s proprietary Smart-Lock welding process and built-in diagnostic technology, the cable ensures long-term measurement stability and reliability, making it an ideal choice for high-precision electrical testing.It is widely used in semiconductor, optoelectronic, and other advanced testing applications.
● Uses imported Belden cable (USA) to ensure exceptional low-leakage performance
● Precision-machined dovetail guideways used for displacement components to guarantee positioning accuracy
● Utilizes PLCTS’s proprietary Smart-Lock welding process and diagnostic technology to ensure long-term stability and reliability
● Customizable length and multi-channel configuration available, providing strong system compatibility
Suitable for RF MeasurementsI/O Point TestingDC TestingWafer TestingResistance & Voltage TestingSolar Cell Testing Photocurrent TestingSemiconductor Device Analysis & Testing
