Probe

s one of the core components of a probe station, the probe is responsible for ma

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产品介绍

As one of the core components of a probe station, the probe is responsible for making contact with the electrode of the device under test (DUT), providing a conductive path for electrical parameter measurements of semiconductor chips.

Depending on the application scenario, probes are available in various types, including:Tungsten probes；Gold-plated tungsten probes；Gold-plated flexible probes；Angled tungsten probes.

These probes are widely used in semiconductor and optoelectronic industries for device testing and characterization.

Technical Advantages:

● Imported tungsten steel probe tips with excellent electrical conductivity
● Ultra-fine and flexible probe wires minimize damage to integrated circuits
● Proprietary gold-plating process enhances conductivity while maintaining mechanical integrity

● Multiple tip diameters available to meet diverse application needs
● Current measurement range: 1 fA to 1 A
● Probes are available in multiple types to suit different testing scenarios

Model List：

Product Name	Model	Length (mm)	Tip Diameter (μm)
Tungsten Probe	PTR-01	38	1 / 3 / 5 / 10 / 30 / 50 / 150 / 300 / 500
Gold-Plated Tungsten Probe	PCR-01	38	1 / 3 / 5 / 10 / 30 / 50 / 150 / 300 / 500
Gold-Plated Flexible Probe	PSR-01	51	5 / 10 / 30 / 50 / 125
Angled Tungsten Probe	LR-01	32	1 / 3 / 5 / 10 / 30 / 50 / 150 / 300 / 500
Beryllium Copper Probe	PBR-01	38	3 / 10 / 30

Application Areas：

I/O Point TestingDC TestingWafer TestingResistance & Voltage TestingSolar Cell Testing Photocurrent TestingSemiconductor Device Analysis & Testing

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Probe

Technical Advantages:

Model List：

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