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Model 2600-TRIAX SMU Connector

The KETF series electrical test adapter is designed for MOSFET wiring and electr

产品介绍

The KETF series electrical test adapter is designed for MOSFET wiring and electrical testing, and is compatible with the Keithley 2600 series source meters. It addresses the issue of inconsistent HI and LO terminal interfaces found in standard setups.

This series is independently developed and manufactured by PULIANG. One end adopts an original U.S.-made terminal block, while the other end features standard triaxial LO and HI connectors, which can be directly connected to PULIANG’s triaxial male probe station cables.

An LO shorting jumper is included, making it easy to short the LO terminals of dual channels, thereby improving measurement accuracy. It is a highly practical and convenient accessory for electrical testing.

Technical Advantages:

  • ● Compatible with Keithley 2600 series source meters

  • ● Solves the inconsistency between LO and HI terminal interfaces

  • ●  One end uses an original U.S.-made terminal block, the other end provides standard BNC or triaxial connectors

  • ● Directly connected to PLCTS probe station triaxial male cables

  • ● Includes LO shorting jumper for easy LO terminal bridging

  • ● Designed for MOSFET wiring and measurement, improving test accuracy

Model List:

ModelConnector TypeLeakage AccuracyVoltage RangeCompatible Source Meter
KETF-EBCoaxial BNC10 pA≤ 1400 VKeithley 2600 Series
KETF-EXTriaxial Connector100 fA≤ 1400 VKeithley 2600 Series

Device Description

The rear panel of the Keithley 2600 series source meters uses a terminal block interface, which may reduce measurement accuracy if used for direct testing.

PULIANG’s triaxial connector series is fully compatible with the 2600 series source meters. It includes an LO shorting jumper, which conveniently allows the two LO terminals of dual channels to be shorted together, thereby improving accuracy.

This adapter is particularly suitable for MOSFET and other three-terminal device measurements, offering a more stable and precise testing setup.

Application Areas:

Suitable for RF MeasurementsI/O Point TestingDC TestingWafer TestingResistance & Voltage TestingSolar Cell Testing Photocurrent TestingSemiconductor Device Analysis & Testing

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