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As a core component of the probe station, the probe holder serves as the critica
As a core component of the probe station, the probe holder serves as the critical interface between the probe tip and signal cable, providing a conductive path for electrical parameter testing of semiconductor chips.
Probe holders can be categorized by positioning accuracy, with common resolutions including 10 μm, 5 μm, 3 μm, 1 μm, and 0.5 μm. They are also available in both manual and motorized versions. Depending on application scenarios, probe holders come in various forms such as standard, universal-angle, and L-shaped types, and are widely used in semiconductor and optoelectronic electrical testing.
RF (Radio Frequency) refers to high-frequency alternating electromagnetic waves in the range of 300 kHz to 300 GHz.
The TPLR Series RF Probe Holder is specifically developed for radio frequency testing applications, offering high-precision displacement adjustment and full compatibility with leading RF probe brands in the industry. With its precise positioning capability and robust mechanical stability, it is an ideal solution for RF signal probing in high-frequency device characterization.
● Main body made of imported aerospace-grade aluminum, ensuring high structural stability and precise linear displacement
● Driven by imported high-resolution micrometer head to ensure precise displacement control
● Multifunctional adjustment clamp compatible with leading RF probe brands in the industry
● Designed for directional probe alignment under a microscope without obstructing the field of view
● High-strength adjustable magnetic base with up to 10 kg magnetic holding force ensures stable contact during probing
● Optional vacuum adsorption upgrade available, compatible with a 7 L/min vacuum pump for enhanced stability
Suitable for RF Measurements
